%0 Journal Article
%T Preparation and characteristic study of nanometer thickness depleted uranium / Au multilayer<br>纳米厚度贫铀/Au多层膜的制备及特性研究
%A Yi Tai-Min
%A Xing Pi-Feng
%A Du Kai
%A Zheng Feng-Cheng
%A Yang Meng-Sheng
%A Xie Jun
%A Li Chao-Yang
%A <br>易泰民
%A 邢丕峰
%A 杜凯
%A 郑凤成
%A 杨蒙生
%A 谢军
%A 李朝阳
%J 物理学报
%D 2012
%I 
%X Modeling and experimental results show that the depleted uranium (DU) and Au"cocktail" nanometer multilayer will improve the X-ray conversion efficiency by reducing energy loss to penetration of the X-ray into the hohlraum wall. DU/Au multilayer plane film is deposited by magnetron sputtering through alternately rotating substrate in front of separate DU and Au sources. The geometry parameter, surface topography, atomic concentration and interface structure of DU/Au multilayer are characterized by white light interferometer, scanning electronic microscope (SEM) and X-ray photoelectron spectroscopy (XPS). Au film becomes continuous when its thickness reaches 8 nm. Combining with theoretical modeling results, 30 nm DU and 8 nm Au multilayer is chosen. The periodic thickness of DU/Au is measured to be about 37 nm. Well-defined Du/Au interface is observed by SEM. Diffusion at DU/Au interface is observed by XPS. The atomic concentration ratio of DU, Au, O is 73:26:1. The binding energy of Au 4f of 8 nm thickness Au film shifts toward high-energy tail about by 0.6 eV. Similar phenomena are unfound in 30 nm thickness DU film.
%K depleted uranium/Au multilayer
%K laser X-ray conversion efficiency
%K atomic concentration
%K cluster effect<br>贫铀/Au多层膜
%K 激光X射线转换效率
%K 原子比
%K 团簇效应
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=29DF2CB55EF687E7EFA80DFD4B978260&aid=78F360FC29C4791195488CFA70E7FDCE&yid=99E9153A83D4CB11&vid=1D0FA33DA02ABACD&iid=5D311CA918CA9A03&sid=42BB4AFD39A960DE&eid=F7FABB30A5C94413&journal_id=1000-3290&journal_name=物理学报&referenced_num=0&reference_num=19