%0 Journal Article
%T Direct measurement of group delay of optical elements
光学元件群延迟的直接测量
%A Deng Yu-Qiang
%A Sun Qing
%A Yu Jing
%A
邓玉强
%A 孙青
%A 于靖
%J 物理学报
%D 2011
%I
%X A technique for direct measurement of group delay of optical elements is introduced. With the joint time-frequency analysis of white-light spectral interferogram, group delay can be directly extracted from the ridge of wavelet-transform. The technique is accurate and simple. The measurement results of group delay and group delay dispersion of a piece of fused silica was demonstrated. The results agree well with those from theoretical calculation, and the noise is greatly reduced. This technique is suitable for various application of white-light interferometer.
%K dispersion measurement
%K white-light interference
%K time-frequency analysis
%K ultrafast laser
色散测量
%K 白光干涉
%K 时间频率分析
%K 超快激光
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=29DF2CB55EF687E7EFA80DFD4B978260&aid=B104CB9AB70CA992D4AA0CE2333A9392&yid=9377ED8094509821&vid=BFE7933E5EEA150D&iid=0B39A22176CE99FB&sid=43626775210451E3&eid=43626775210451E3&journal_id=1000-3290&journal_name=物理学报&referenced_num=0&reference_num=11