%0 Journal Article
%T Piezoelectric discharge characteristic of ZnO nanorod studied with atomic force microscopy<br>原子力显微技术研究ZnO纳米棒的压电放电特性
%A Shao Zheng-Zheng
%A Wang Xiao-Feng
%A Zhang Xue-Ao
%A Chang Sheng-Li
%A <br>邵铮铮
%A 王晓峰
%A 张学骜
%A 常胜利
%J 物理学报
%D 2010
%I 
%X Piezoelectric discharge characteristic of semiconductor ZnO nanorod was studied with atomic force microscope in contact mode. The c-axial orientation ZnO nanorod array film was fabricated with two-step wet-chemical method. Electric pulses were got when Pt coated probe contact-scans the ZnO nanorod, their peak value reaches 120 pA. The electric pulse is related with the topography of ZnO nanorod and has a time duration of 30 ms. The contact of Pt coated probe and ZnO nanorod behaves as a Schottky diode. The I-V curve showed the piezoelectric voltage must be larger than 0.3 V to drive Schottky diode. The resistance of Schottky contact has a magnitude of GΩ order during piezoelectric discharge, which is the major factor impacting the output of piezoelectric potential.
%K ZnO
%K nanorod
%K piezoelectric discharge
%K Schottky contact<br>ZnO，
%K 纳米棒，
%K 压电放电，
%K 肖特基接触
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=29DF2CB55EF687E7EFA80DFD4B978260&aid=2653EFE8194CEC0A8EF5FAD2649B02A4&yid=140ECF96957D60B2&vid=6AC2A205FBB0EF23&iid=CA4FD0336C81A37A&sid=64808317C39DF331&eid=D8414BC1307BF1A3&journal_id=1000-3290&journal_name=物理学报&referenced_num=0&reference_num=0