%0 Journal Article
%T Using conductive atomic force microscope on carbon nanotube networks<br>碳纳米管网络导电特征的导电型原子力显微镜研究
%A Zhao Hua-Bo
%A Li Zhen
%A Li Rui
%A Zhang Zhao-Hui
%A Zhang Yan
%A Liu Yu
%A Li Yan
%A <br>赵华波
%A 李震
%A 李睿
%A 张朝晖
%A 张岩
%A 刘宇
%A 李彦
%J 物理学报
%D 2009
%I 
%X Conductive atom force microscopy observations have been performed on carbon nanotube networks. The results indicate that within an imaging range of several tens of micrometers the resistance of a carbon nanotube is much smaller than the contact resistance between two crossed carbon nanotubes and so the potential difference hardly appears along a carbon nanotube if the carbon nanotube network is electrically biased. Besides, if several semiconducting carbon nanotubes wind into a bundle, they tend to appear like metallic carbon nanotubes.
%K conductive atomic force microscope
%K carbon nanotube networks
%K carbon nanotube conductivity<br>导电型原子力显微镜
%K 碳纳米管网络
%K 碳管纳米电导
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=29DF2CB55EF687E7EFA80DFD4B978260&aid=B131F452F36BD3CFDAFD71C19D03A1D9&yid=DE12191FBD62783C&vid=9FFCC7AF50CAEBF7&iid=59906B3B2830C2C5&sid=79F37CC6A619CB9F&eid=120C71BAFD38E90E&journal_id=1000-3290&journal_name=物理学报&referenced_num=0&reference_num=0