%0 Journal Article
%T Investigation of characteristic microstructures of wild ginseng by X-ray phase contrast microscopy
利用X射线相衬显微研究野山参的特征结构
%A Xue Yan-Ling
%A Xiao Ti-Qiao
%A Wu Li-Hong
%A Chen Can
%A Guo Rong-Yi
%A Du Guo-Hao
%A Xie Hong-Lan
%A Deng Biao
%A Ren Yu-Qi
%A Xu Hong-Jie
%A
薛艳玲
%A 肖体乔
%A 吴立宏
%A 陈灿
%A 郭荣怡
%A 杜国浩
%A 谢红兰
%A 邓彪
%A 任玉琦
%A 徐洪杰
%J 物理学报
%D 2010
%I
%X X-ray phase contrast microscopy (XPCM) achieves the high contrast imaging of low electron density materials with the spatial coherence peculiarity of X-rays. Considering that ginsengs are mainly composed of C, H, O, N and other low-Z elements, XPCM is an ideal tool to nondestructively investigate the characteristic microstructures of ginsengs in principle. Owing to the higher fluxes and luminance of the third generation of synchrotron radiation facility, it can present clearer and finer microstructures of ginsengs with better spatial and temporal resolutions. In this paper, the characteristic microstructures of wild ginseng ware investigated systemically by XPCM at Shanghai Synchrotron Radiation Facility (SSRF). For comparison, the characteristic structures of cultivated ginseng are also studied correspondingly. Moreover, a kind of new microstructure is found in young ginsengs, which is possibly a new characteristic structure of ginsengs. The results demonstrates that XPCM is a promising new method of identifying wild ginseng.
%K x-ray phase contrast microscopy
%K synchrotron radiation
%K microscopic identification
%K characteristic microstructures of ginseng
X射线相衬显微
%K 同步辐射
%K 显微鉴定
%K 人参特征结构
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=29DF2CB55EF687E7EFA80DFD4B978260&aid=E90BF20A35E8E129B19EB7C16F407B69&yid=140ECF96957D60B2&vid=6AC2A205FBB0EF23&iid=5D311CA918CA9A03&sid=2683D9EC99CF89D7&eid=4DC36C216342D37F&journal_id=1000-3290&journal_name=物理学报&referenced_num=1&reference_num=23