%0 Journal Article
%T Shot noise measurement methods in electronic devices<br>电子器件散粒噪声测试方法研究
%A Chen Wen-Hao
%A Du Lei
%A Zhuang Yi-Qi
%A Bao Jun-Lin
%A He Liang
%A Chen Hua
%A Sun Peng
%A Wang Ting-Lan
%A <br>陈文豪
%A 杜磊
%A 庄奕琪
%A 包军林
%A 何亮
%A 陈华
%A 孙鹏
%A 王婷岚
%J 物理学报
%D 2011
%I 
%X The limitations to shot noise measurement methods based on superconducting quantum interference device (SQUID) and superconductivity-insulation-superconductor (SIS) Josephson junction are pointed out, and a method to measure the shot noises of conventional electronic devices is proposed. Shot noise characteristics of conventional electronic devices are analyzed, and then a low-temperature measurement system is established. By using a double-shielding construction and low noise preamplifier, the test system can achieve a good electromagnetic interference shielding and low background noise. The theoretical and the experimental results of shot noises in diodes at 10 K are in good agreement with each other. The accuracy and the credibility of measurement system are proved.
%K shot noise
%K electronic devices
%K noise measurement<br>散粒噪声
%K 电子器件
%K 噪声测试
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=29DF2CB55EF687E7EFA80DFD4B978260&aid=0E0D16C392E579C556117C7A8277DC8D&yid=9377ED8094509821&vid=BFE7933E5EEA150D&iid=94C357A881DFC066&sid=F764B1664E2B4C1B&eid=43608FD2E15CD61B&journal_id=1000-3290&journal_name=物理学报&referenced_num=0&reference_num=30