%0 Journal Article
%T Thickness dependence of the interfacial interaction for the Fe/ZnO (0001) system studied by photoemission<br>Fe/ZnO (0001)体系界面相互作用中薄膜厚度效应的光电子能谱研究
%A Zhang Wang
%A Xu Fa-Qiang
%A Wang Guo-Dong
%A Zhang Wen-Hu
%A Li Zong-Mu
%A Wang Li-Wu
%A Chen Tie-Xin
%A <br>张旺
%A 徐法强
%A 王国栋
%A 张文华
%A 李宗木
%A 王立武
%A 陈铁锌
%J 物理学报
%D 2011
%I 
%X Synchrotron radiation photoemission spectroscopy (SRPES) and conventional X-ray photoelectron spectroscopy (XPS) were used to study the Fe/ZnO(0001 ) interface formation at room temperature. The interaction extent of Fe overlayer during the ZnO substrate was carefully monitored during the increase of Fe coverage, the results showed obvious Fe2+ formation at the initial stage of Fe deposition. Based on the photoemission spectra (PES) changes observed during the deposition of Fe on ZnO up to 3 nm, three meaningful and critical thicknesses have been observed which may be related to the surface charge transport, chemical reaction, and magnetic property, respectively. The new finding may be helpful to the design of related devices based on Fe/ZnO interface.
%K Fe/ZnO
%K interfacial reaction
%K synchrotron radiation photoelectron spectroscopy
%K X-ray photoelectron spectroscopy<br>Fe/ZnO
%K 界面作用
%K 同步辐射光电子能谱
%K X射线光电子能谱
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=29DF2CB55EF687E7EFA80DFD4B978260&aid=CC56CB84A233BB6148F9801AA20C3583&yid=9377ED8094509821&vid=BFE7933E5EEA150D&iid=CA4FD0336C81A37A&sid=27E22BE79650B79D&journal_id=1000-3290&journal_name=物理学报&referenced_num=0&reference_num=30