%0 Journal Article
%T Calculation on runaway process of high-energy fast electrons under nanosecond-pulse<br>纳秒脉冲下高能量快电子逃逸过程的计算
%A Shao Tao
%A Sun Guang-Sheng
%A Yan Ping
%A Gu Chen
%A Zhang Shi-Chang
%A <br>邵涛
%A 孙广生
%A 严萍
%A 谷琛
%A 张适昌
%J 物理学报
%D 2006
%I 
%X The runaway breakdown model induced by fast electrons is promising in explaining the nanosecond-pulse breakdown. In this paper, runaway process and collision ionization of fast electrons are discussed. Based on the relations between the electron energy and effective retarding force, the evolution of injected electron energy as a function of distance away from the avalanche head was simulated. The higher applied electric filed strength is, the lower the runaway energy threshold is and the more fast electrons can runaway, and gas pressures affect the runaway process of fast electrons greatly. Moreover, the runaway breakdown process under the high-voltage nanosecond pulse is described qualitatively.
%K gas discharge
%K fast electron
%K runaway breakdown
%K nanosecond pulse<br>气体放电
%K 快电子
%K 逃逸击穿
%K 纳秒脉冲
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=29DF2CB55EF687E7EFA80DFD4B978260&aid=29432E6884F23667&yid=37904DC365DD7266&vid=E514EE58E0E50ECF&iid=708DD6B15D2464E8&sid=3D61DE9D83D35841&eid=8FC2FB2E1E6106D2&journal_id=1000-3290&journal_name=物理学报&referenced_num=0&reference_num=20