%0 Journal Article
%T CHARACTERIZATION OF THE TWO-PHASE STRUCTURE IN SEMICRYSTALLINE POLY(ETHYLENE TEREPHTHALATE)
半结晶聚酯(PET)的二相共存结构的表征
%A HAN FU-TIAN
%A GUO LI-PING
%A LIU Ping-an
%A TANG Zhen-fang
%A SHI QI-HONG
%A
韩甫田
%A 郭立平
%A 刘平安
%A 唐振方
%A 施其宏
%J 物理学报
%D 2001
%I
%X The X-ray diffraction whole pattern (XDWP) data of semicrystalline poly (ethylene terephthalate) PET2 sample were collected in the symmetric reflection geometry on a diffractometer, employing a copper target (Kα wavelength=0.15418nm).The XDWP was fitted by combining the Rietveld method and Fourier filtering technique,Rietveld structure refinement for PET2 crystalline phase was done,the unit-cell parameters obtained being a=0.445,b=0.592,c=1.072nm,α=99.6,β=116.9,γ=111.9(°),and the density of the sample being dc=1.495(g/cm3).Meanwhile, the XDWP was separated into two parts,CR2 crystalline region and AM2 non-crystalline region in PET2.The reduced radial distribution function G2(r) was calculated from AM2, finding three main peaks,G21(r)=0.150,G22(r)=0.254,G23(r)=0.460nm, which characterize the structure of the non-crystalline phase in PET2.We suggest that the amorphous curve is best taken as the sum of several non-crystalline scattering peaks.Reliability and reasonableness of the structural parameters of the crystalline phase and the non-crystalline phase are discussed.In conclusion,it is a very effective method that the combination based on the Fourier filtering technique and the full-pattern diffraction least-squares refinement (Rietveld method) and the radial distribution function analyses to study the two-phase structure in semi-crystalline polymers.
%K poly(ethylene terephthalate)
%K the two-phase coexistent structure
%K Rietveld method
%K radial distribution function
%K Fourier filtering technique
聚对苯二甲酸乙二醇酯
%K 二相共存结构
%K 径向分布函数
%K Rietveld方法
%K Fourier过滤技术
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=29DF2CB55EF687E7EFA80DFD4B978260&aid=A490C545C2B5B2E1&yid=14E7EF987E4155E6&vid=771152D1ADC1C0EB&iid=B31275AF3241DB2D&sid=9D30FB531DC548C0&eid=70024E0C77AE588F&journal_id=1000-3290&journal_name=物理学报&referenced_num=1&reference_num=22