%0 Journal Article
%T RESONANT X-RAY DYNAMICAL DIFFRACTION METHOD FOR DETERMINING TEMPERATURE FACTOR<br>测定温度因子的共振X射线动力学衍射法
%A XU ZHANG-CHENG
%A GUO CHANG-LIN
%A ZHAO ZONG-YAN
%A XU JIA-YUE
%A ZHOU SHENG-MING
%A QI ZE-MING
%A T FUKAMACHI
%A R NEGISHI
%A T NAKAJIMA
%A <br>徐章程
%A 郭常霖
%A 赵宗彦
%A 徐家跃
%A 周圣明
%A 戚泽明
%A 深町共荣
%A 根岸利一郎
%A 中岛哲夫
%J 物理学报
%D 1998
%I 
%X A new method for determining the separate temperature factors (STF) for different atoms in two-atom compound crystals is put forward. Using the characteristics of resonant X-ray dynamical diffraction by perfect crystals near the atomic absorption edge,two equations of STF are derived. As the parameters in the equations can be obtained from experimental measurement and theoretical calculation, STF can be determined by solving the equations. We applied this method to a perfect crystal GaAs at 300K, and obtained BGa=0.4573×10-20m2,BAs=0.7339×10-20m2. This method may be extended to the cases of multi-atom compound crystals.
%K 温度因子
%K X射线动力学
%K 双原子
%K 晶体
%K 衍射
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=29DF2CB55EF687E7EFA80DFD4B978260&aid=478BD5F0F36565A6017EC33F76D83899&yid=8CAA3A429E3EA654&vid=F4B561950EE1D31A&iid=9CF7A0430CBB2DFD&sid=E36FA098A813D3FB&eid=6A46E5A5880213FE&journal_id=1000-3290&journal_name=物理学报&referenced_num=0&reference_num=7