%0 Journal Article %T Enhanced chromaticity of organic electroluminescence from silicon-based organic microcavity
电致发光色纯性增强的硅基有机微腔 %A Xiong Zu-Hong %A Shi Hua-Zhong %A Fan Yong-Liang Zhang Song-Tao Zhan Yi-Qiang He Jun Zhong Gao-Yu Xu Shao-Hui Liu Yi Wang Xiao-Jun Wang Zi-Jun Ding Xun-Min %A
熊祖洪 %A 史华忠 %A 樊永良 %A 张松涛 %A 詹义强 %A 何 钧 %A 钟高余 %A 徐少辉 %A 柳 毅 %A 王晓军 %A 王子君 %A 丁训民 %A 黄 维 %A 侯晓远 %J 物理学报 %D 2003 %I %X Electroluminescence (EL) from Si-based organic microcavity has firstly been reported in the literature. The microcavity is made up of the central active multilayers sandwiched between a silver film and a porous silicon Bragg reflector (PS-DBR), formed by electrochemical etching of p +-Si substrate in the electrolyte of HF: C 2H 5OH:H 2O. The central active multilayers consist of Al (1 nm) / LiF (0 5 nm) / Alq 3 / Alq 3: DCJTB / NPB / CuPc / ITO / SiO 2. The reflectivity (relative to an Al mirror) of the PS-DBR is up to 99%, and the stopband is about 160 nm wide. Resonant cavity mode appears as a tip in the reflectivity spectrum of the Si-based organic multilayer films, indicating that the Si-based organic multilayer structure is indeed a microcavity. The peak widths of the EL spetra are greatly reduced from 70 nm to 12 nm as compared with those measured from non-cavity structures. Note that the EL emission from the cavity devices is single-mode, and the off-resonant optical modes are highly suppressed. Moreover, an increase of a factor of about 4 of the resonant peak intensity is observed. In addition, the current-brightness-voltage characteristics and the effect of parameters on the lifetime of the cavity devices are also discussed. The present technique for obtaining enhanced EL emission from Si-based organic microcavity may also be another novel effective method for realizing all-Si-based photonic devices and optoelectronics device integration. %K electrochemical etching %K electroluminescence %K narrowed emission %K Si-based organic microcavity
硅基有机微腔 %K 电致发光 %K 电化学腐蚀 %K 色纯性 %K 有机光发射器件 %K 有机光发射显示器 %U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=29DF2CB55EF687E7EFA80DFD4B978260&aid=9B73992AE7BF5439&yid=D43C4A19B2EE3C0A&vid=286FB2D22CF8D013&iid=94C357A881DFC066&sid=966030800FCA5D46&eid=10088244B073A3DF&journal_id=1000-3290&journal_name=物理学报&referenced_num=3&reference_num=40