%0 Journal Article
%T Enhanced chromaticity of organic electroluminescence from silicon-based organic microcavity
电致发光色纯性增强的硅基有机微腔
%A Xiong Zu-Hong
%A Shi Hua-Zhong
%A Fan Yong-Liang Zhang Song-Tao Zhan Yi-Qiang He Jun Zhong Gao-Yu Xu Shao-Hui Liu Yi Wang Xiao-Jun Wang Zi-Jun Ding Xun-Min
%A
熊祖洪
%A 史华忠
%A 樊永良
%A 张松涛
%A 詹义强
%A 何 钧
%A 钟高余
%A 徐少辉
%A 柳 毅
%A 王晓军
%A 王子君
%A 丁训民
%A 黄 维
%A 侯晓远
%J 物理学报
%D 2003
%I
%X Electroluminescence (EL) from Si-based organic microcavity has firstly been reported in the literature. The microcavity is made up of the central active multilayers sandwiched between a silver film and a porous silicon Bragg reflector (PS-DBR), formed by electrochemical etching of p +-Si substrate in the electrolyte of HF: C 2H 5OH:H 2O. The central active multilayers consist of Al (1 nm) / LiF (0 5 nm) / Alq 3 / Alq 3: DCJTB / NPB / CuPc / ITO / SiO 2. The reflectivity (relative to an Al mirror) of the PS-DBR is up to 99%, and the stopband is about 160 nm wide. Resonant cavity mode appears as a tip in the reflectivity spectrum of the Si-based organic multilayer films, indicating that the Si-based organic multilayer structure is indeed a microcavity. The peak widths of the EL spetra are greatly reduced from 70 nm to 12 nm as compared with those measured from non-cavity structures. Note that the EL emission from the cavity devices is single-mode, and the off-resonant optical modes are highly suppressed. Moreover, an increase of a factor of about 4 of the resonant peak intensity is observed. In addition, the current-brightness-voltage characteristics and the effect of parameters on the lifetime of the cavity devices are also discussed. The present technique for obtaining enhanced EL emission from Si-based organic microcavity may also be another novel effective method for realizing all-Si-based photonic devices and optoelectronics device integration.
%K electrochemical etching
%K electroluminescence
%K narrowed emission
%K Si-based organic microcavity
硅基有机微腔
%K 电致发光
%K 电化学腐蚀
%K 色纯性
%K 有机光发射器件
%K 有机光发射显示器
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=29DF2CB55EF687E7EFA80DFD4B978260&aid=9B73992AE7BF5439&yid=D43C4A19B2EE3C0A&vid=286FB2D22CF8D013&iid=94C357A881DFC066&sid=966030800FCA5D46&eid=10088244B073A3DF&journal_id=1000-3290&journal_name=物理学报&referenced_num=3&reference_num=40