%0 Journal Article
%T Investigation of defect properties in doped diamond films<br>掺杂金刚石薄膜的缺陷研究
%A Hu Xiao-Jun
%A Li Rong-Bin
%A Shen He-Sheng
%A He Xian-Chang
%A Deng Wen
%A Luo Li-Xiong
%A <br>胡晓君
%A 李荣斌
%A 沈荷生
%A 何贤昶
%A 邓 文
%A 罗里熊
%J 物理学报
%D 2004
%I 
%X The defect properties in chemical vapor deposition diamond films doped by sulfur and boron were investigated by the Doppler broadening measurements and electron paramagnetic resonance (EPR). The results show that the defects annihilating the positrons is almost the same in various doped films, and the interactions between the dopants and the positrons are not distinct. In addition, a small amount of boron atoms can improve the quality of diamond films. The EPR signals of the diamond films arise from carbon dangling bonds.
%K diamond
%K doping
%K Doppler broadening measurements
%K EPR<br>金刚石
%K 掺杂
%K 多普勒增宽谱
%K 电子顺磁共振
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=29DF2CB55EF687E7EFA80DFD4B978260&aid=E43E28D103FA74FC&yid=D0E58B75BFD8E51C&vid=8E6AB9C3EBAAE921&iid=B31275AF3241DB2D&sid=9EAD63ADE6B277ED&eid=EA357AD73C8E13BC&journal_id=1000-3290&journal_name=物理学报&referenced_num=0&reference_num=22