%0 Journal Article
%T SMALL-ANGLE X-RAY DIFFRACTION IN ANALYSES OF THE STRUCTURE OF COATINGS<br>簿膜结构分析中的低角X射线衍射方法
%A SHAO JIAN-DA
%A FAN ZHENG-XIU
%A YIN GONG-JIE
%A YUAN LI-XIANG
%A <br>邵建达
%A 范正修
%A 殷功杰
%A 袁利祥
%J 物理学报
%D 1994
%I 
%X The period thickness mean refraction corrected factor and the ratio between two difference materials in a period can be deduced from the Bragg equation with refraction correction. Based on this Bragg's law and theory of optical thin film, the formula introduced in this paper have been verified in theory and experiment with short-period Mo/Si multilayers.
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=29DF2CB55EF687E7EFA80DFD4B978260&aid=FE5A2846D6F7F9669D977C0388442C99&yid=3EBE383EEA0A6494&vid=BE33CC7147FEFCA4&iid=B31275AF3241DB2D&sid=808D6B9EB5A8B4B4&eid=78AF84DBB4041008&journal_id=1000-3290&journal_name=物理学报&referenced_num=0&reference_num=0