%0 Journal Article
%T THE EFFECT OF ANNEALING ON THE X-RAY DIFFRACTION OF W/C PERIODIC MULTILAYERS<br>退火对W/C周期性多层膜X射线衍射性能的影响
%A JIANG XIAO-MING
%A JIANG ZUI-MIN
%A LIU WEN-HAN
%A WU ZI-QIN
%A <br>姜晓明
%A 蒋最敏
%A 刘文汉
%A 吴自勤
%J 物理学报
%D 1988
%I 
%X The behaviors of amorphous W/C periodic multilayers after annealing have been studied by precise low-angle X-ray diffraction. Afte refraction correction, the period of multilayers can be calculated more accurately using th low angle peaks. The period increases with increasing annealing temperatures. The intensities of 2nd and 3rd Bragg diffraction also increase with the annealing temperatures. These phenomena can be interpreted by the increase of thickness of the carbon layers.
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=29DF2CB55EF687E7EFA80DFD4B978260&aid=BD74894CB9B9C4F4DA33A2D03A36D4DE&yid=0702FE8EC3581E51&vid=42425781F0B1C26E&iid=708DD6B15D2464E8&sid=27DC88857EA57257&eid=5349C9BD3C454FC9&journal_id=1000-3290&journal_name=物理学报&referenced_num=0&reference_num=0