%0 Journal Article
%T EFFECTS OF THE HIGH DENSITY CHARGED DEFECT STATES AT THE CuPc/InP INTERFACE ON RAMAN SCATTERING OF CuPc LB FILM<br>CuPc　LB膜与InP接触界面电荷态对Raman光谱的影响
%A KONG XIANG-GUI
%A LIU YI-CHUN
%A E SHU-LIN
%A <br>孔祥贵
%A 刘益春
%A 鄂书林
%J 物理学报
%D 1994
%I 
%X 报道Ｃｕｐｃ／ＩｎＰ异质结的整流（Ｊ－Ｖ）特性和电容电压（Ｃ－Ｖ）特性，并研究了界面态对ＣｕＰｃＬＢ膜Ｒａｍａｎ光谱的影响。
%K 异质结
%K 界面态
%K 散射谱
%K LB膜
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=29DF2CB55EF687E7EFA80DFD4B978260&aid=E59EF3BFB336D3C9D57984F5D789EB4B&yid=3EBE383EEA0A6494&vid=BE33CC7147FEFCA4&iid=94C357A881DFC066&sid=AF407E3178C0B145&eid=07C52AC66061533A&journal_id=1000-3290&journal_name=物理学报&referenced_num=0&reference_num=1