%0 Journal Article
%T THE APPLICATION OF SECOND ORDER DIFFRACTION OF A MONOCHROMETER IN LABORATORY EXAFS MEASUREMENT<br>实验室EXAFS测量中单色器晶体二级衍射的应用
%A WANG WEN-CAI
%A YANG CHUN-LAI
%A CHEN YU
%A <br>王文采
%A 杨春来
%A 陈玉
%J 物理学报
%D 1990
%I 
%X Some aspects on the application of second order diffraction of a monochrometer in laboratory EXAFS measurement are studied. Significant distortions in measured X-ray absorption fine structure occur when there are impurities' emission lines on the continuum spectra m the investigated energy range. A method for correcting that distortion is proposed. As the EXAFS amplitude decreases, which is caused by the application of second order diffraction of a monochrometer, how to obtain correct structural parameters is also discussed.
%K EXAFS
%K 单色器
%K 晶体
%K 衍射
%K 吸收谱
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=29DF2CB55EF687E7EFA80DFD4B978260&aid=B3DDC7DF860AD9D5EC2B05C99062CA4C&yid=8D39DA2CB9F38FD0&vid=7C3A4C1EE6A45749&iid=F3090AE9B60B7ED1&sid=FE397BCF5D340F6F&eid=721F8E311AAA0176&journal_id=1000-3290&journal_name=物理学报&referenced_num=0&reference_num=3