%0 Journal Article
%T NO-STANDARDS QUANTITATIVE EDS ANALYSIS OF THE CONSTITUENTS OF BINARY ALLOYS CONTAINING LIGHT ELEMENTS<br>含轻元素二元合金成分的无标样X光能谱定量分析
%A ZHANG REN-JI
%A GE SEN-LIN
%A WU ZI-QIN
%A <br>张人佶
%A 葛森林
%A 吴自勤
%J 物理学报
%D 1981
%I 
%X In this article, the no-standards quantitative analysis method using the ratios of the X-ray intensities of the elements in the samples has been improved. The "full diffusion" model of the electron scattering has been properly modified and simplified and a stepped depth distribution curve of the X ray has been obtained. From this distribution curve, the quantitative relationship between the constituents of samples and the intensities of the characteristic X-rays has been determined. The analysed values of the Cu-Si, FeS2 NaCl and GaAs are coincident with the actual values. Our results are better in some extent than the results of Russ's method which used the calculated X-ray intensity factors of pure elements and the routine ZAF correction. The calculation procedure of our method is also simpler than the procedure of the latter method.
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=29DF2CB55EF687E7EFA80DFD4B978260&aid=8C816531FEFD545BE757EE09CC8CCC73&yid=AA64127AB7DEB65D&vid=340AC2BF8E7AB4FD&iid=0B39A22176CE99FB&sid=3D9746C06EC12B45&eid=F9F74EC1AA08A7B9&journal_id=1000-3290&journal_name=物理学报&referenced_num=0&reference_num=0