%0 Journal Article
%T THE PROBE-WANDER ERROR OF FOUR-PROBE RESISTIVITY MEASUREMENTS ON SEMICONDUCTOR<br>四深针法测半导体电阻率的探针游移误差
%A DING SHOU-CHAN
%A <br>丁守谦
%J 物理学报
%D 1966
%I 
%X In this paper a general formula was derived for semiconductor resistivity measurements, in which four probes may be set in any positions. From this formula, we have obtained a general expression for calculating the probe-wander error; and the transverse probe-wander as well as the longitudinal probe-wander error have been considered simultaneously. So, we can evaluate the probe-wander errores of linear probes and square probes. In addition, we have derived the probe-wander error in sheet specimens measurements with these two kinds of probes. Theory has indicated that the probe-wander error cannot be ignored in an accurate measurement. Lastly, we have discussed the methods of eliminating or decreasing the probe-wander error.
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=29DF2CB55EF687E7EFA80DFD4B978260&aid=215D28201C6D319A&yid=C7EA1836BA194C9B&vid=BC12EA701C895178&iid=DF92D298D3FF1E6E&sid=B3645A659773B73C&eid=15890B67B1F0B7E7&journal_id=1000-3290&journal_name=物理学报&referenced_num=0&reference_num=0