%0 Journal Article
%T RELIABILITY OF CIRCUIT ELEMENTS BY REDUNDANCY METHOD<br>群体组合法提高电路元件可靠性的分析
%A CHAI ZHEN-MING
%A <br>柴振明
%J 物理学报
%D 1964
%I 
%X The capability of redundancy method for increasing the reliability of circuit elements of both switch- and nonswitch-type is investigated in this paper. The reliability gain of various ways of circuit connections is derived with regard to open circuit and short circuit failures. The change of loading effects of all redundant elements due to the failure of a few elements among them is also considered. The evaluation of the average life of a redundancy elements shows that the redundancy technique is particularly suitable for short period operation or nonreparable systems. Some design considerations for practical applications are discussed in substantial detial with illustrations.
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=29DF2CB55EF687E7EFA80DFD4B978260&aid=77A28D1DEA9F21F1&yid=29B68C6EE36B014B&vid=A04140E723CB732E&iid=5D311CA918CA9A03&sid=703F3C1B6594BA64&eid=4D0B71A09FA5A2A5&journal_id=1000-3290&journal_name=物理学报&referenced_num=0&reference_num=0