%0 Journal Article %T Experimental and Numerical Analysis of Thermal Deformation of Electronic Packages,QFP and MCM %A Yasuyuki Morit %A Kazuo Arakawa %A Mitsugu Todo %A
Yasuyuki Morit %A Kazuo Arakaw %A Mitsugu Todo %J 实验力学 %D 2006 %I %X 0Introduction Anelectronicpackageisgenerallyconstructedwithanactivesiliconchip,mountisland,gold wires,leadframesandsoldersasshowninFig.1(a).Toprotectfromtheenvironment,thesilicon chipisusuallyencapsulatedinresin.SincethesematerialshavedifferentCTE(coefficientofthermal expansion),stressandstrainaregeneratedbyinternalheatinginserviceoperationorthermalloading fromtheenvironment1].Insomecases,thismaycausefailureofthewireandcrackinganddebonding insidethepackage.Thereliabilityofelectronicpackages… %K 数字分析 %K 热形变 %K 电子仪器组件 %K QFP %K MCM %U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=5D344E2AD54D14F8&jid=49067A0A0D864088C06A84AACB51A5B2&aid=58910A0F89374DBB&yid=37904DC365DD7266&vid=659D3B06EBF534A7&iid=CA4FD0336C81A37A&sid=708DD6B15D2464E8&eid=2A8D03AD8076A2E3&journal_id=1001-4888&journal_name=实验力学&referenced_num=1&reference_num=7