%0 Journal Article
%T Structural and optical properties of Cd0.8Zn0.2S thin films<br>Cd0.8Zn0.2S 薄膜的结构和光学性质
%A Di Xi
%A Tian Caijuan
%A Tang Rongzhe
%A Li Wei
%A Feng Lianghuan
%A Zhang Jingquan
%A Wu Lili
%A Lei Zhi
%A <br>狄霞
%A 田彩娟
%A 唐容喆
%A 李卫
%A 冯良桓
%A 张静全
%A 武莉莉
%A 雷智
%J 半导体学报
%D 2011
%I 
%X Cd1-xZnxS thin films were deposited on glass substrates by a vacuum coevaporation method. The structural, compositional, and optical properties of as-deposited Cd0.8Zn0.2S films were investigated using X-ray diffraction (XRD), X-ray fluorescence (XRF), X-ray photoelectron spectroscopy (XPS), and optical transmittance spectrum. The thin films are hexagonal in structure, with strong preferential orientation along the (002) planes. The composition of Cd1-xZnxS thin films monitored by a quartz crystal oscillator agrees well with that obtained from XRF and XPS measurements. The optical constants, such as refractive index, single-oscillator energy, dispersion energy, absorption coefficients, and the optical band gap, were deduced by the Swanepoel's method, in combination with the Wemple and DiDomenico single-oscillator model, from the transmission spectrum of Cd0.8Zn0.2S thin films.
%K ternary compound
%K thin films
%K coevaporation<br>三元化合物
%K 薄膜
%K 共蒸发
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=025C8057C4D37C4BA0041DC7DE7C758F&aid=786307CB160BCFD2FD271054F36FB84F&yid=9377ED8094509821&vid=9971A5E270697F23&iid=0B39A22176CE99FB&sid=FDDD94162FB9B23E&eid=E158A972A605785F&journal_id=1674-4926&journal_name=半导体学报&referenced_num=0&reference_num=0