%0 Journal Article
%T Thermal analysis of the cavity facet for an 808 nm semiconductor laser by using near-field scanning optical microscopy<br>基于扫描近场光学显微镜的808nm半导体激光器腔面热特性分析
%A Rao Lan
%A Song Guofeng
%A Chen Lianghui
%A <br>饶岚
%A 宋国峰
%A 陈良惠
%J 半导体学报
%D 2010
%I 
%X In order to analyze the thermal characteristics of the cavity facet of a semiconductor laser, a home-built near-field scanning optical microscopy (NSOM) is employed to probe the topography of the facet. By comparing the topographic images of two samples under different DC current injections, we can find that the thermal characteristic is related to its lifetime. We show that it is possible to predict the lifetime of the semiconductor laser diode with non-destructive tests.
%K semiconductor laser
%K NSOM
%K thermal expansion<br>半导体激光器
%K 近场扫描显微镜
%K 热膨胀
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=025C8057C4D37C4BA0041DC7DE7C758F&aid=C2E781699FEDA89581D2A290F1DDDC97&yid=140ECF96957D60B2&vid=4AD960B5AD2D111A&iid=F3090AE9B60B7ED1&sid=5A62EBBABA86C363&eid=94C357A881DFC066&journal_id=1674-4926&journal_name=半导体学报&referenced_num=0&reference_num=0