%0 Journal Article
%T Magnetic Force Microscopy Study of Alternate Sputtered (001) Oriented L10 Phase FePt Films<br>Magnetic Force Microscopy Study of Alternate Sputtered （001） Oriented L1o Phase FePt Films
%A XIA Ai-Lin
%A CAO Jiang-Wei
%A TONG Liu-Niu
%A WEI Fu-Lin
%A YANG Zheng
%A HAN Bao-Shan
%A <br>夏爱林
%A 曹江伟
%A 童六牛
%A 魏福林
%A 杨正
%A 韩宝善
%J 中国物理快报
%D 2007
%I 
%X We present a magnetic force microscopy study of alternate sputtered （001） oriented L1o phase FePt films. It is found that the root-mean-square value of phase shift of magnetic force images, （ △Ф）rms, can be used to characterize the perpendicular anisotropy for a series of specimens. Therefore, the considerable improvement of the perpendicular anisotropy after post-annealing can be characterized. In addition, the magnetic properties, magnetic and crystalline microstructures before and after post-annealing are compared for the typical Fe5nm Pt5 nm]10 film with substrate temperature T8 = 500℃, single layer thickness d = 5 nm and total layer thickness D=100 nm to confirm the effect of post-annealing on improving the perpendicular anisotropy for Fe-Pt films.
%K 75
%K 50
%K Ss
%K 75
%K 30
%K Gw
%K 75
%K 60
%K Ch
%K 68
%K 37
%K Rt<br>磁力
%K 显微镜
%K 溅射
%K 薄膜
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=E27DA92E19FE279A273627875A70D74D&aid=A6F1F92187EC7BB8C829033457AB0BF6&yid=A732AF04DDA03BB3&vid=B91E8C6D6FE990DB&iid=CA4FD0336C81A37A&sid=8B59EA573021D671&eid=4966445AEEBA9556&journal_id=0256-307X&journal_name=中国物理快报&referenced_num=0&reference_num=0