%0 Journal Article
%T Reliability test and failure analysis of high power LED packages<br>
%A Chen Zhaohui
%A Zhang Qin
%A Wang Kai
%A Luo Xiaobing
%A Liu Sheng
%A <br>
%J 半导体学报
%D 2011
%I 
%K LED package
%K ASLP
%K accelerated reliability test
%K failure analysis<br>
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=025C8057C4D37C4BA0041DC7DE7C758F&aid=2B495ADC77990CCC78554E225C9EE2B4&yid=9377ED8094509821&vid=9971A5E270697F23&iid=CA4FD0336C81A37A&sid=C837701BFB69934A&eid=E158A972A605785F&journal_id=1674-4926&journal_name=半导体学报&referenced_num=0&reference_num=0