%0 Journal Article
%T Switching Magnetization Magnetic Force Microscopy ¡ª An Alternative to Conventional Lift-Mode MFM
%A Vladim¨ªr Cambel
%A Dagmar Gregu ov¨¢
%A Peter Eli¨¢
%A J¨¢n Fedor
%A Ivan Kosti
%A J¨¢n Ma¨¾ka
%A Peter Ballo
%J Journal of Electrical Engineering
%D 2011
%I 
%R 10.2478/v10187-011-0006-2
%X In the paper we present an overview of the latest progress in the conventional lift-mode magnetic force microscopy (MFM) technique, achieved by advanced MFM tips and by lowering the lift height. Although smaller lift height offers improved spatial resolution, we show that lowered tip-sample distance mixes magnetic, atomic and electric forces. We describe an alternative to the lift-mode procedure - Switching Magnetization Magnetic Force Microscopy [SM-MFM], which is based on two-pass scanning in tapping mode AFM with reversed tip magnetization between the scans. We propose design and calculate the magnetic properties of such SM-MFM tips. For best performance the tips must exhibit low magnetic moment, low switching field, and single-domain state at remanence. The switching field of such tips is calculated for Permalloy hexagons.
%K magnetic force microscopy
%K micromagnetic calculations
%K switching field
%U http://versita.metapress.com/content/h2q0t37217513157/?p=a673e9384528416e8a014f5b0d28b699&pi=5