%0 Journal Article %T Structural, Electrical and Optical Characteristics of Zn100¨CxCdxO Thin Films %A Hend Alkhammash %A H. Abd El-Ghanny %A M. M. Abd El-Raheem %J Open Access Library Journal %V 5 %N 8 %P 1-12 %@ 2333-9721 %D 2018 %I Open Access Library %R 10.4236/oalib.1104687 %X
Thin films of Zn100-xCdxO with x = 0, 2, 4, 6 and 8 at% were deposited by electron beam evaporation technique on glass substrates. The structural, optical and electrical properties of Zn100-xCdxO films with x = 4 at% have been investigated as a function of annealing temperature. Only zinc and cadmium appeared in the as-deposited films, by annealing their oxides found to exist. It was observed that the optical properties, such as transmittance, reflectance, optical band gap, and refractive index of Zn100-xCdx, were strongly affected by annealing temperature. Other parameters named free carrier concentration, electrical resistivity of the films were studied as a function of annealing temperature for 4 at% CdO content. The figure indicates that the best value of annealing temperature is at 450¡æ.
%K Zn100¨CxCdxO %K Zinc %U http://www.oalib.com/paper/5297137