%0 Journal Article
%T Structural, Electrical and Optical Characteristics of Zn100¨CxCdxO Thin Films
%A Hend Alkhammash
%A H. Abd El-Ghanny
%A M. M. Abd El-Raheem
%J Open Access Library Journal
%V 5
%N 8
%P 1-12
%@ 2333-9721
%D 2018
%I Open Access Library
%R 10.4236/oalib.1104687
%X
Thin films of Zn100-xCdxO with
x = 0, 2, 4, 6 and 8 at% were deposited by electron
beam evaporation technique on glass substrates. The structural, optical and
electrical properties of Zn100-xCdxO films with x = 4 at%
have been investigated as a function of annealing temperature. Only zinc and
cadmium appeared in the as-deposited films, by annealing their oxides found to
exist. It was observed that the optical properties, such as transmittance, reflectance, optical band
gap, and refractive index of Zn100-xCdx, were strongly affected by annealing temperature.
Other parameters named free carrier concentration, electrical resistivity of
the films were studied as a function of annealing temperature for 4 at% CdO
content. The figure indicates that the best value of annealing temperature is
at 450¡æ.
%K Zn100¨CxCdxO
%K Zinc
%U http://www.oalib.com/paper/5297137