%0 Journal Article
%T Complex Permittivity Measurements at Variable Temperatures of Low Loss Dielectric Substrates Employing Split Post and Single Post Dielectric Resonators
%A Janina E. Mazierska
%A Mohan V. Jacob
%A Dimitri O. Ledenyov
%A Jerzy Krupka
%J Physics
%D 2012
%I arXiv
%R 10.1109/MWSYM.2004.1338959
%X A split post dielectric resonator in a copper enclosure and a single post dielectric resonator in a cavity with superconducting end-plates have been constructed and used for the complex permittivity measurements of single crystal substrates. (La,Sr)(Al,Ta)O3, LaAlO3, MgO and quartz substrates have been measured at temperatures from 20 K to 300 K in the split post resonator and from 15 K to 80 K in the single post resonator. The TE01delta mode resonant frequencies and unloaded Qo-factors of the empty resonators at temperature of 20 K were: 9.952 GHz and 25,000 for the split post resonator and 10.808 GHz and 240,000 for the single post resonator respectively.
%U http://arxiv.org/abs/1209.0111v1