%0 Journal Article
%T Layer dependent band dispersion and correlations using tunable Soft X-ray ARPES
%A N. Kamakura
%A Y. Takata
%A T. Tokushima
%A Y. Harada
%A A. Chainani
%A K. Kobayashi
%A S. Shin
%J Physics
%D 2003
%I arXiv
%R 10.1209/epl/i2004-10052-6
%X Soft X-ray Angle-Resolved Photoemission Spectroscopy is applied to study in-plane band dispersions of Nickel as a function of probing depth. Photon energies between 190 and 780 eV were used to effectively probe up to 3-7 layers. The results show layer dependent band dispersion of the Delta_2 minority-spin band which crosses the Fermi level in 3 or more layers, in contrast to known top 1-2 layers dispersion obtained using ultra-violet rays. The layer dependence corresponds to an increased value of exchange splitting and suggests reduced correlation effects in the bulk compared to the surface.
%U http://arxiv.org/abs/cond-mat/0311547v2