%0 Journal Article
%T Advanced atomic force microscopy techniques
%A Thilo Glatzel
%A Hendrik H£żlscher
%A Thomas Schimmel
%A Mehmet Z. Baykara
%J Beilstein Journal of Nanotechnology
%D 2012
%I 
%R 10.3762/bjnano.3.99
%K atomic force microscopy
%U http://dx.doi.org/10.3762/bjnano.3.99