%0 Journal Article %T Survey on post-silicon debug for multi-core processor
多核处理器硅后调试技术研究最新进展 %A GAO Jian-liang %A HAN Yin-he %A
高建良 %A 韩银和 %J 计算机应用研究 %D 2013 %I %X This paper surveyed the post-silicon debug of uncertain bugs in multi-core processor. Firstly, it presented the challenges of debugging multi-core processor, especially for uncertain bugs. Then, it introduced and analyzed the state-of-the-art solutions for post-silicon debug in detail. Furthermore, it discussed the advantages and disadvantages of the existing methods. Finally, it concluded the hot topics of the current research and also presented the future directions. %K multi-core processor %K post-silicon debug %K uncertain bug
多核处理器 %K 硅后调试 %K 非确定性错误 %U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=8240383F08CE46C8B05036380D75B607&jid=A9D9BE08CDC44144BE8B5685705D3AED&aid=51EFA6F8AD100243EA9E7BE0248C3D53&yid=FF7AA908D58E97FA&vid=340AC2BF8E7AB4FD&iid=0B39A22176CE99FB&sid=4AD4BA66429F5627&eid=90612DF06FCE4D55&journal_id=1001-3695&journal_name=计算机应用研究&referenced_num=0&reference_num=37