%0 Journal Article
%T Simulation of effect of atomic process on poloidal CXRS measurement<br>原子过程对极向CXRS测量影响的数值模拟
%A Zhang Ting
%A Ding Bo-Jiang
%A <br>张霆
%A 丁伯江
%J 物理学报
%D 2006
%I 
%X With consideration of the effects of atomic process, a simple code modeling the correction to poloidal charge-exchange recombination spectroscopy (CXRS) measure ment is developed. The simulation results show that the measured poloidal veloci ty shift is overestimated in the ion diamagnetic drift direction and the apparen t ion temperature is underestimated because of the effects of energy-dependent e mission rate and finite lifetime of excited ions. This deviation will be more ob vious with the increase of temperature or magnetic field. The contributions from gradients of density and temperature are negligible compared to that from the a tomic process.
%K atomic process
%K simulation
%K plasma<br>原子过程
%K 数值模拟
%K 等离子体
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=29DF2CB55EF687E7EFA80DFD4B978260&aid=71BBAE85128678E4&yid=37904DC365DD7266&vid=E514EE58E0E50ECF&iid=38B194292C032A66&sid=39F2A646778CAD6A&eid=5AF7AC8009D8B9DB&journal_id=1000-3290&journal_name=物理学报&referenced_num=0&reference_num=4