OALib Journal期刊

ISSN: 2333-9721



匹配条件: “Vinod Tyagi” ,找到相关结果约1377条。
Codes Correcting Blockwise s-Periodic Errors
Pankaj Kr Das,Vinod Tyagi
International Journal of Information and Network Security (IJINS) , 2012, DOI: 10.11591/ijins.v2i2.1930
Abstract: In this paper, we obtain lower and upper bounds for linear codes which are capable of correcting the errors blockwise that occur during the process of transmission. The kinds of errors considered are known as s-periodic errors. Illustrations for such kind of codes have also been provided.
Codes Detecting and Locating Periodic Errors
P. K. Das,Vinod Tyagi
Journal of Theoretical Physics and Cryptography , 2013,
Abstract: Error-locating codes (EL codes), first proposed by J. K. Wolf and B. Elspas in 1963, have the potential to be used to identify the faulty module for fault isolation and reconfiguration in fault-tolerant computer systems. This paper proposes a new class of EL codes suitable for systems with periodic errors. The authors obtain lower and upper bounds on the number of parity check digits required for a linear code that detects and locates errors which are periodic in nature. An illustration of such a code is also provided.
Ageing Effect of Sb2Te3 thin films
P. Arun,Pankaj Tyagi,A. G. Vedeshwar,Vinod Kumar Paliwal
Physics , 2003, DOI: 10.1016/S0921-4526(01)01032-8
Abstract: Post deposition variation in film resistance of Sb2Te3 films deposited on glass substrates at room temperature and an elevated temperature (110oC) are investigated. The resistance of films grown at room temperature shows a non-linear decrease with time which is thickness dependent as opposed to the increasing resistance of film grown at elevated temperature. The decreasing resistance with time can be attributed to the transformation of an amorphous phase of the as-grown film to a micro-crystalline phase as revealed by X-ray diffraction. The increasing resistance was found to be due to the surface oxidation (Sb2O3) and a diffusion as a function of time. However, the underneath layer of Sb2Te3 below the top Sb2O3 layer remains amorphous even after two years from the date of fabrication.
Synthesis, characterization and biocidal properties of platinum metal complexes derived from 2,6-diacetylpyridine (bis thiosemicarbazone)  [PDF]
Monika Tyagi, Sulekh Chandra
Open Journal of Inorganic Chemistry (OJIC) , 2012, DOI: 10.4236/ojic.2012.23007
Abstract: The coordination compounds of PdII, PtII, RhIII and IrIII metal ions with a Schiff base ligand (L) i.e. 2,6- diacetylpyridine bis(thiosemicarbazone) have been synthesized and characterized by elemental analyses, molar conductance, magnetic susceptibility measurements, IR, NMR and electronic spectral studies. On the basis of molar conductance and elemental analyses the complexes were found to have composition [M(L)]Cl2 and [M’(L)Cl]Cl2, where M = Pd(II), Pt(II) and M’ = Rh(III), Ir(III). The spectral studies reveal that the complexes possess monomeric composition. Complexes of PdII and PtII were found to have four coordinated square planar geometry whereas the complexes of RhIII and IrIII posses six coordinated octahedral geometry. The ligand field parameters were calculated using various energy level diagrams. In vitro synthesized compounds and metal salts have been tested against some species of plant pathogenic fungi and bacteria in order to assess their antimicrobial properties.
Reliability Analysis of a Powerloom Plant Using Interval Valued Intuitionistic Fuzzy Sets  [PDF]
Sanjay Kumar Tyagi
Applied Mathematics (AM) , 2014, DOI: 10.4236/am.2014.513193

In this paper, we investigate the reliability analysis of a powerloom plant by using interval valued intuitionistic fuzzy sets (IVIFS). Herein, we modeled a powerloom plant as a gracefully degradable system having two units A(n) and B(m) connected in series. The reliability ofncomponents of unitAandmcomponents of unitBis assumed to be an IVIFS defined over the universe of discourse [0, 1]. Thus, the reliability of the system obtained is an IVIFS that covers the inherited uncertainty in data collection and reliability evaluation of a powerloom plant.

Significant Factors for Reliability Estimation of Component Based Software Systems  [PDF]
Kirti Tyagi, Arun Sharma
Journal of Software Engineering and Applications (JSEA) , 2014, DOI: 10.4236/jsea.2014.711083
Abstract: Software reliability is defined as the probability of the failure-free operation of a software system for a specified period of time in a specified environment. Traditional approaches for software reliability analysis are black box approaches. These approaches use the software as a whole. At present, main emphasis of software is on reuse, hence component based software applications came into existence. Black box models are not appropriate for these applications. This paper introduces some significant factors for reliability estimation of Component Based Software Applications. Reliability of Component Based Software Application depends upon these factors. This paper also gives the definition of factors and explains its relation with reliability of software application.
Dynamics of Particle in a Box in Time Varying Potential Due to Chirped Laser Pulse  [PDF]
Brijender Dahiya, Vinod Prasad
Journal of Modern Physics (JMP) , 2010, DOI: 10.4236/jmp.2010.16053
Abstract: We describe a computational method for simulating the time dependent quantum mechanical system inter-acting with external field. In this method the Schrödinger equation is solved by expanding the wave function in the basis set of unperturbed Hamiltonian. The expansion yields a set of coupled first order differential equation. For expansion coefficients, the coupled channel method is applied to a particle in a box interacting with external field in the form of chirped laser pulse. The pulse shape is taken as Gaussian. We study the ef-fect of different pulse parameters i.e. chirp rate, intensity, center frequency, box length and laser duration on the dynamics of the particle. Many interesting results are obtained and explained.
Newborn Sex Selection and India’s Overpopulation Problem  [PDF]
Hrishikesh D. Vinod
Modern Economy (ME) , 2013, DOI: 10.4236/me.2013.42013

We begin by noting how India is highly overpopulated and that this creates negative externalities for world environment. Next, we note that females in child-bearing ages alone determine the birth rate, compounding the population growth anywhere. Third, forcing families to have unwanted daughters can increase discrimination against women. Fourth, most countries impose no restrictions on women choosing the sex of their next baby. We use these propositions to argue that cultural preference against daughters in India has important benefits until India achieves net reproduction rate of unity. We argue that the correct policy for malnourished overpopulated India must be the exact opposite of the focus in North America and Europe, where they have an obesity epidemic and declining populations.

Integrated Area-power Optimal State Assignment
Akhilesh Tyagi
VLSI Design , 2001, DOI: 10.1155/2001/39405
Abstract: This paper presents a state assignment algorithm with the objective of lower energy along with area comparable to the area-targeting state assignments such as JEDI. The underlying framework is MUSTANG's complete weighted graph with weights representing state affinity. The weight computation phase estimates the computation energy of potential common cubes using steady state probabilities for transitions. The weight computation phase also identifies a large set of potential state cliques, which are incorporated into a recursive bipartitioning based state assignment procedure. Reuse of cliques identified by the weight computation phase results in a faster and efficient state assignment. The energy targeting weights result in ≈9% lower area and 18% lower power than area targeting weights in JEDI over 29 MCNC Logic Synthesis ‘93 benchmarks. The clique based state assignment performs almost as well as the annealing based state assignment in JEDI, and takes only about half as much time.
Statistical Module Level Area and Delay Estimation
Akhilesh Tyagi
VLSI Design , 1997, DOI: 10.1155/1997/78238

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