Article citations

    A. Biswas, A. K. Poswal, R. B. Tokas and D. Bhattacharyya, “Characterization of Ion Beam Sputter Deposited W and Si Flms and W/Si Interfaces by Grazing Incidence X-Ray Reflectivity, Atomic Force Microscopy and Spectroscopic Ellipsometry,” Applied Surface Science, Vol. 254, No. 11, 2008, pp. 3347-3356. doi:10.1016/j.apsusc.2007.11.025

has been cited by the following article: