The article is to studythe development of computer-aided design of X-ray microtomography—the device for
investigating the structure and construction of three-dimensional images of organic and
inorganic objects on the basis of shadow projections. This article provides
basic information regarding CAD of X-ray microtomography and a scheme
consisting of three levels. The article also shows basic relations of X-ray
computed tomography, the generalized scheme of an X-ray microtomographic
scanner. The methods of X-ray imaging of the spatial microstructure andmorphometry of
materials are described. The main characteristics of an X-ray microtomographic
scanner, the X-ray source, X-ray optical elements and mechanical components of
the positioning system are shown. The block scheme and software functional
scheme for intelligent neural network system of analysis of the internal
microstructure of objects are presented. The method of choice of design parameters of CAD
of X-ray microtomography aims at improving the quality of design and reducing costs of it. It is supposed to reduce the design time
and eliminate the growing number of engineers involved in development and
construction of X-ray microtomographic scanners.
M. A. Bubenchikov, E. E. Gazieva, A. O. Gafurov, G. S. Glushkov, D. S. Zhdanov, D. V. San’kov, V. I. Syryamkin, S. V. Shidlovskii and A. V. Yurchenko, “Modern Methods of Materials Research and Nanotechnologies,” Tomsk State University Press, Tomsk, 2010, 366 p.
E. N. Bogomolov, V. V. Brazovskiy and V. I. Syryamkin, “Method of Calculating of Digital X-Ray Microtomographic Scanners,” 13th International Scientific Conference on Measurement, Control, Information, Altai State Technical University Press, Barnaul, 2012, pp. 29-32.
E. N. Bogomolov, V. V. Brazovskiy, V. I. Syryamkin, V. A. Borodin, A. Sh. Bureev and A. V. Vasiliev, “Engineering Calculation of X-Ray Microtomographic Scanners,” Multifunctional Chemical Materials and Technologies, Tomsk, 2012, pp. 307-309.