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DEPENDENCE OF ADHESION OF FILMS OF TELLURIDE UPON ITS MI CROSTRUCTURE
碲化物薄膜的附着牢固度与其显微结构的关系

Keywords: telluride,film,microstructure,adhesion
碲化物
,薄膜,显微结构,附着牢固度

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Abstract:

Microstructures of single layer of telluride and telluride/ZnS multilayer on Si and Ge substrates were investigated by XRD and TEM. The correlation between adhesion and microstructure of layers was given.

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