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PHOTOLUMINESCENCE AND RAMAN SCATTERING SPECTROSCOPIES OF MBE-GROWN Hg0.68Cd0.32Te EPILAYER
分子束外延Hg0.68Cd0.32Te薄膜光致发光和喇曼散射的研究

Keywords: Hg,0,68,Cd,0,32,Te films,photoluminescence (PL),Raman scattering,far,infrared transmittance spectra(FIT)
光致发光
,红外材料,喇曼散射,远红外,汞镉碲

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Abstract:

Using photoluminescence (PL) and Raman scattering (RS), the MBE grown Hg 1- x Cd x Te ( x =0.325) epilayers were studied. The PL measurement shows a strong near band emission peak with a FWHM of 5meV, which indicates high crystal quality obtained. Three peaks, the relatively strong HgTe like TO mode at 119cm -1 and HgTe like LO at 139cm -1 and a weak LA mode at 93cm -1 , were observed on RS spectra. The weak peak at 93cm -1 has not been reported previously. The assignment of the peak is based on the comparison with the result of far infrared transmittance spectra(FIT).

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