%0 Journal Article
%T Relevance of Microstructure on Optical Properties of Thermally Evaporated Indium Oxide Thin Films
%A Parveen Jain
%A Sukhvir Singh
%A Avanish Kumar Srivastava
%A Sandeep Kumar Pundir
%A Azher Majid Siddiqui
%J Open Access Library Journal
%V 2
%N 1
%P 1-15
%@ 2333-9721
%D 2015
%I Open Access Library
%R 10.4236/oalib.1101200
%X Nanocrystalline indium oxide thin films of thickness about 100 nm have
been deposited using thermal
vacuum evaporation technique at room temperature on glass and quartz substrates
and subsequently annealed at different temperatures (150¡æ, 200¡æ, 250¡æ, 300¡æ,
350¡æ, 500¡æ and 700¡æ) for 2 hr and 4 hr in the oxygen atmosphere. Structural
and optical properties of these films have been investigated by using XRD, SEM,
HRTEM, AFM, UV-Visible, and photoluminescence spectroscopy. Response of gas
towards the thin films is obtained. X-ray diffraction studies of deposited and
annealed films show the transformation of indium into indium oxide thin films
at 300¡æ. UV-visible and PL studies reveal the band gap of 3.7 eV. The
transparency of thin films is about 83%. Gas response is obtained 3.55 for
ethanol vapours. Structural features associated with the indium oxide thin
films have been correlated with optical parameters.
%K Vacuum Evaporation
%K Photoluminescence
%K UV-Visible
%K Gas Sensing
%U http://www.oalib.com/paper/3131373